Electromagnetic Fields( Series - Ieee Press Series On Electromagnetic Wave Theory )

This definitive text and reference on electromagnetic fields has been updated and expanded to twice its original content. It incorporates the latest methods, theory, formulations, and applications that relate to today's technologies. With an emphasis on basic principles and a focus on electromagnetic formulation and analysis, "Electromagnetic Fields, Second Edition" includes:

Detailed discussions of electrostatic fields, potential theory, propagation in waveguides and unbounded space, scattering by obstacles, penetration through apertures, and field behavior at high and low frequencies

Many analytical developments suitable for exploitation by the numerical analyst, including the popular method of moments

Comprehensive discussion of singularities of sources and fields with delineations of field properties at edges and at sector and cone vertices

Extensive appendices that of themselves are worth the cost of the book

A large, useful, carefully compiled set of references

With descriptions of methods for solving problems and with many applications of theory to electromagnetic engineering, this is a valuable resource for students, professors, and practicing engineers. It is also a comprehensive textbook for graduate-level courses in various aspects of electromagnetic theory.

Professor Jean Van Bladel, an eminent researcher and educator in fundamental electromagnetic theory and its application in electrical engineering, has updated and expanded his definitive text and reference on electromagnetic fields to twice its original content. This new edition incorporates the latest methods, theory, formulations, and applications that relate to today's technologies. With an emphasis on basic principles and a focus on electromagnetic formulation and analysis, Electromagnetic Fields, Second Edition includes detailed discussions of electrostatic fields, potential theory, propagation in waveguides and unbounded space, scattering by obstacles, penetration through apertures, and field behavior at high and low frequencies.