Book: Transmission Electron Microscopy And Diffractometry Of Materials This introduction presents the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM.
Details of Book: Transmission Electron Microscopy And Diffractometry Of Materials Book: Transmission Electron Microscopy And Diffractometry Of Materials
Author: Brent Fultz, James M. Howe, B. Fultz
ISBN: 3540678417
ISBN-13: 9783540678410
, 978-3540678410
Binding: Hardcover
Publishing Date: 2001-02-15
Publisher: Springer
Number of Pages: 748
Language: English