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    Efficient Test Data Compression and Fault Analysis in VLSI Circuits

    Efficient Test Data Compression and Fault Analysis in VLSI Circuits  (English, Paperback, Subramaniam Sivaganesan)

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    Author
    Subramaniam Sivaganesan
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    Highlights
    • Language: English
    • Binding: Paperback
    • Publisher: Scholars' Press
    • Genre: Technology & Engineering
    • ISBN: 9786138834304
    • Pages: 84
    Specifications
    Book Details
    Imprint
    • Scholars' Press
    Dimensions
    Width
    • 5 mm
    Height
    • 229 mm
    Length
    • 152 mm
    Weight
    • 136 gr
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