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    Tdcv Characterization of Defects in Ultra Thin Sio2 Kinds of Films

    Tdcv Characterization of Defects in Ultra Thin Sio2 Kinds of Films  (English, Paperback, Rosaye Jean-Yves)

    Price: Not Available
    Currently Unavailable
    Author
    Rosaye Jean-Yves
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    Highlights
    • Language: English
    • Binding: Paperback
    • Publisher: LAP Lambert Academic Publishing
    • Genre: Science
    • ISBN: 9783838351544, 3838351541
    • Pages: 120
    Specifications
    Book Details
    Imprint
    • LAP Lambert Academic Publishing
    Dimensions
    Width
    • 7 mm
    Height
    • 229 mm
    Length
    • 152 mm
    Weight
    • 186 gr
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