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    Test Driven Development for Embedded C
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    Test Driven Development for Embedded C (English, Paperback, Grenning James W.)

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    Test Driven Development for Embedded C  (English, Paperback, Grenning James W.)

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    ₹1,250
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    Author
    Grenning James W.
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    Highlights
    • Language: English
    • Binding: Paperback
    • Publisher: Shroff Publishers & Distributors Pvt Ltd
    • Genre: Computers
    • ISBN: 9789351107965, 9789351107965
    • Pages: 380
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    ShroffPublishers
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    • Specifications
    Book Details
    Imprint
    • Shroff Publishers & Distributors Pvt Ltd
    Dimensions
    Width
    • 10 mm
    Height
    • 240 mm
    Length
    • 180 mm
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