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    VLSI Test Principles and Architectures

    VLSI Test Principles and Architectures  (English, Electronic book text, Wang Laung-Terng)

    Price: Not Available
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    Author
    Wang Laung-Terng
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    Highlights
    • Language: English
    • Binding: Electronic book text
    • Publisher: Morgan Kaufmann Publishers
    • Genre: Technology & Engineering
    • ISBN: 9780080474793, 0080474799
    • Pages: 808
    Specifications
    Imprint
    • Morgan Kaufmann Publishers
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