Materials scientists, silicon technologists and TCAD researchers come together in this book to share experimental results and physical models, discuss achievements and challenges, and identify key issues for future research in this field. The volume focuses on many aspects related to doping of semiconductors (Si, SiGe and Ge) for device fabrication, and explores areas for single-gate as well as multi-gate devices with planar and vertical architectures. Surface properties, coverage, bonding saturation and passivation, and annealing ambient are also discussed.
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Specifications
Book Details
Imprint
Materials Research Society
Series & Set Details
Series Name
MRS Proceedings
Dimensions
Width
20 mm
Height
235 mm
Length
160 mm
Weight
500 gr
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