NEW IMAGE PROCESSING TECHNOLOGY  (Paperback, Prof. (Dr.) B. K. Sarkar,Rani Aher,Prof. (Dr.) Reena Singh,Shalini Yadav)

Since only the images obtained by a scanning electron microscope (SEM) and a transmission electron microscope (TEM) were used in this work and since both techniques are well- established, only a brief introduction is given on the principles and instrumentation of SEM and TEM aiming to show what kind of information is expressed through the images obtained by these techniques. An image is the optical representation of an object illuminated by a radiation source. The following elements are present in an image formation process: an object, a radiation source (visible light, X-rays, electrons, etc.) and an image formation system. The mathematical model which describes the image formation, depends on the radiation source, on the physics of the radiation-object interaction and on the acquisition system used. A beam of high energy electrons is the radiation source in SEM and TEM. When it strikes a sample a number of phenomena occur simultaneously which is taken form shows different signals generated by the interaction of an electron beam with a solid. Theelectron interaction volume and the volume from which the different signals are originating.